Please submit your quote request for NSN part 8001538-425 (Microcircuit Memory) using the RFQ form below. This part 8001538-425 is manufactured by Honeywell International Inc (07187) and carries NSN 5962-01-334-4982. To expedite processing, kindly provide the requested quantity and need-by date in the designated form fields.
For reference, this part 8001538-425 has an NSN of 5962-01-334-4982, with a NIIN of 01-334-4982 and an NCB Code of 01 (USA). It falls under FSG 59 Electrical and Electronic Equipment Components and FSC 5962 Microcircuits Electronic for classification purposes. Providing complete details ensures we prioritize your request effectively.
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NSN | FSC | NIIN | CLS | Hazmat | DEMIL | Cancelled NSN |
---|---|---|---|---|---|---|
5962-01-334-4982 Item Description: Microcircuit Memory | 5962 | 013344982 | 0 | N | B | |
CIIC | HCC | ESD | PMIC | Criticality | ENAC | |
U | B | A | 0 | |||
Part Number | ISC | RNVC | RNCC | HCC | MSDS | SADC |
8001538-425 | 5 | 1 | 5 |
MRC | Criteria | Characteristic |
---|---|---|
ADAT | BODY WIDTH | 0.220 INCHES MINIMUM AND 0.310 INCHES MAXIMUM |
ADAU | BODY HEIGHT | 0.210 INCHES MAXIMUM |
AFGA | OPERATING TEMP RANGE | -55.0/+125.0 DEG CELSIUS |
AFJQ | STORAGE TEMP RANGE | -65.0/+150.0 DEG CELSIUS |
CQSZ | INCLOSURE CONFIGURATION | DUAL-IN-LINE |
CQWX | OUTPUT LOGIC FORM | TRANSISTOR-TRANSISTOR LOGIC |
CQZP | INPUT CIRCUIT PATTERN | 14 INPUT |
CWSG | TERMINAL SURFACE TREATMENT | SOLDER |
CZEN | VOLTAGE RATING AND TYPE PER CHARACTERISTIC | 7.0 VOLTS MAXIMUM POWER SOURCE |
CZEQ | TIME RATING PER CHACTERISTIC | 37.00 NANOSECONDS MAXIMUM PROPAGATION DELAY TIME, LOW TO HIGH LEVEL OUTPUT AND 37.00 NANOSECONDS MAXIMUM PROPAGATION DELAY TIME, HIGH TO LOW LEVEL OUTPUT |
CZER | MEMORY DEVICE TYPE | ROM |
CZZZ | MEMORY CAPACITY | UNKNOWN |
TTQY | TERMINAL TYPE AND QUANTITY | 24 PRINTED CIRCUIT |
CBBL | FEATURES PROVIDED | HERMETICALLY SEALED AND BURN IN AND ELECTROSTATIC SENSITIVE AND PROGRAMMED AND BIPOLAR |
ADAQ | BODY LENGTH | 1.290 INCHES MAXIMUM |
CQSJ | INCLOSURE MATERIAL | CERAMIC |
TEST | TEST DATA DOCUMENT | 96906-MIL-STD-883 STANDARD (INCLUDES INDUSTRY OR ASSOCIATION STANDARDS, INDIVIDUAL MANUFACTUREER STANDARDS, ETC.). |
End Use : 21320 | Semiconductors |
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Schedule B : 8542900000 (NAICS 334413) | Electronic integrated circuits and microassembly parts |
SITC : 77689 | Parts of electronic integrated circuits and microassembles |
ADPE | Represents items with no adp components |
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CRITL | The item does not have a nuclear hardened feature but does have other critical featur (s) such as tolerance, fit restrictions or application. |
ESD | B - Represents items with esd sensitivity. |
HMIC | N - Indicates there is no data in the hmirs and the nsn is in a fsc not generally suspected of containing hazardous materials. |
PMIC | A - Item does not contain precious metal. |
AAC | J |
---|---|
Classification Control | 7 |
MGMT_CTL | Sf9wf-n |
Quantity per pack | 1 |
Repariability | |
Shelf Life | N/A |
SOS | Sms |
Unit of Measure | Ea |
ACC: | H - Instruments/equipment/supplies for radio, communications, electrical, laboratory, etc. (includes signal corps) |
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ADC: | A - Shipment is not a consolidation and does not exceed 84 inches in any dimension. |
LCL: | P - 77.5 |
LTL: | W - Rating variable |
NMFC: | 061700 - Elec appliances/instruments noi |
SHC: | 9 - Other or no special handling required (sh) |
TCC: | Z - No special type of cargo code applicable |
WCC: | 72D - Communications/electronics, other than sigint/ew or comsec repair parts and components |
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