Please submit your quote request for NSN part MC3100FH2 (Microcircuit Digital) using the RFQ form below. This part MC3100FH2 is manufactured by Freescale Semiconductor Inc (04713) and carries NSN 5962-00-370-0419. To expedite processing, kindly provide the requested quantity and need-by date in the designated form fields.
For reference, this part MC3100FH2 has an NSN of 5962-00-370-0419, with a NIIN of 00-370-0419 and an NCB Code of 00 (USA). It falls under FSG 59 Electrical and Electronic Equipment Components and FSC 5962 Microcircuits Electronic for classification purposes. Providing complete details ensures we prioritize your request effectively.
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NSN | FSC | NIIN | CLS | Hazmat | DEMIL | Cancelled NSN |
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5962-00-370-0419 Item Description: Microcircuit Digital | 5962 | 003700419 | 0 | N | A | |
CIIC | HCC | ESD | PMIC | Criticality | ENAC | |
U | G | |||||
Part Number | ISC | RNVC | RNCC | HCC | MSDS | SADC |
Mc3100fh2 | 3 | 9 | 5 |
MRC | Criteria | Characteristic |
---|---|---|
ADAQ | BODY LENGTH | 0.240 INCHES MINIMUM AND 0.275 INCHES MAXIMUM |
ADAT | BODY WIDTH | 0.240 INCHES MINIMUM AND 0.260 INCHES MAXIMUM |
ADAU | BODY HEIGHT | 0.030 INCHES MINIMUM AND 0.070 INCHES MAXIMUM |
AEHX | MAXIMUM POWER DISSIPATION RATING | 88.0 MILLIWATTS |
AFGA | OPERATING TEMP RANGE | -55.0/+125.0 DEG CELSIUS |
AFJQ | STORAGE TEMP RANGE | -65.0/+150.0 DEG CELSIUS |
CBBL | FEATURES PROVIDED | MONOLITHIC AND HERMETICALLY SEALED AND HIGH SPEED AND POSITIVE OUTPUTS AND DARLINGTON-CONNECTED |
CQSJ | INCLOSURE MATERIAL | CERAMIC AND GLASS |
CQSZ | INCLOSURE CONFIGURATION | FLAT PACK |
CQWX | OUTPUT LOGIC FORM | TRANSISTOR-TRANSISTOR LOGIC |
CQZP | INPUT CIRCUIT PATTERN | QUAD 2 INPUT |
CSSL | DESIGN FUNCTION AND QUANTITY | 4 GATE, NAND |
CTFT | CASE OUTLINE SOURCE AND DESIGNATOR | T0-86 JOINT ELECTRON DEVICE ENGINEERING COUNCIL |
CZEQ | TIME RATING PER CHACTERISTIC | 10.00 NANOSECONDS MAXIMUM PROPAGATION DELAY TIME, LOW TO HIGH LEVEL OUTPUT AND 10.00 NANOSECONDS MAXIMUM PROPAGATION DELAY TIME, HIGH TO LOW LEVEL OUTPUT |
PMLC | PRECIOUS MATERIAL AND LOCATION | TERMINALS GOLD |
PRMT | PRECIOUS MATERIAL | GOLD |
TEST | TEST DATA DOCUMENT | 96906-MIL-STD 883 STANDARD (INCLUDES INDUSTRY OR ASSOCIATION STANDARDS, INDIVIDUAL MANUFACTUREER STANDARDS, ETC.). |
End Use : 21320 | Semiconductors |
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Schedule B : 8542900000 (NAICS 334413) | Electronic integrated circuits and microassembly parts |
SITC : 77689 | Parts of electronic integrated circuits and microassembles |
CRITL | The item does not have a nuclear hardened feature or any other critical feature such as tolerance, fit restriction or application. |
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HMIC | N - Indicates there is no data in the hmirs and the nsn is in a fsc not generally suspected of containing hazardous materials. |
PMIC | G - Item contains gold. |
AAC | V |
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Classification Control | U |
MGMT_CTL | 16e2--- |
Quantity per pack | No qup |
Repariability | This is a nonreparable item. if condemned or economically unserviceable, then dispose at the level authorized replace the item. |
Shelf Life | N/A |
SOS | S9e |
Unit of Measure | Ea |
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