Please submit your quote request for NSN part SC65599FH (Microcircuit Digital) using the RFQ form below. This part SC65599FH is manufactured by Freescale Semiconductor Inc (04713) and carries NSN 5962-00-137-7477. To expedite processing, kindly provide the requested quantity and need-by date in the designated form fields.
For reference, this part SC65599FH has an NSN of 5962-00-137-7477, with a NIIN of 00-137-7477 and an NCB Code of 00 (USA). It falls under FSG 59 Electrical and Electronic Equipment Components and FSC 5962 Microcircuits Electronic for classification purposes. Providing complete details ensures we prioritize your request effectively.
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NSN | FSC | NIIN | CLS | Hazmat | DEMIL | Cancelled NSN |
---|---|---|---|---|---|---|
5962-00-137-7477 Item Description: Microcircuit Digital | 5962 | 001377477 | 0 | N | B | |
CIIC | HCC | ESD | PMIC | Criticality | ENAC | |
U | B | A | 0 | |||
Part Number | ISC | RNVC | RNCC | HCC | MSDS | SADC |
Sc65599fh | 3 | 9 | 5 |
MRC | Criteria | Characteristic |
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ADAQ | BODY LENGTH | 0.350 INCHES MINIMUM AND 0.400 INCHES MAXIMUM |
ADAT | BODY WIDTH | 0.200 INCHES MINIMUM AND 0.300 INCHES MAXIMUM |
ADAU | BODY HEIGHT | 0.008 INCHES MINIMUM AND 0.100 INCHES MAXIMUM |
AEHX | MAXIMUM POWER DISSIPATION RATING | 280.0 MILLIWATTS |
AFGA | OPERATING TEMP RANGE | -55.0/+125.0 DEG CELSIUS |
AFJQ | STORAGE TEMP RANGE | -65.0/+150.0 DEG CELSIUS |
CBBL | FEATURES PROVIDED | HERMETICALLY SEALED AND MONOLITHIC AND POSITIVE OUTPUTS AND MEDIUM POWER AND MEDIUM SPEED AND COMPLEMENTARY OUTPUTS AND W/ENABLE |
CQSJ | INCLOSURE MATERIAL | CERAMIC AND GLASS |
CQSZ | INCLOSURE CONFIGURATION | FLAT PACK |
CQWX | OUTPUT LOGIC FORM | TRANSISTOR-TRANSISTOR LOGIC |
CQZP | INPUT CIRCUIT PATTERN | 6 INPUT |
CSSL | DESIGN FUNCTION AND QUANTITY | 4 LATCH, D |
CTFT | CASE OUTLINE SOURCE AND DESIGNATOR | -0-004-AG JOINT ELECTRON DEVICE ENGINEERING COUNCIL |
CZEQ | TIME RATING PER CHACTERISTIC | 40.00 NANOSECONDS MAXIMUM PROPAGATION DELAY TIME, LOW TO HIGH LEVEL OUTPUT AND 25.00 NANOSECONDS MAXIMUM PROPAGATION DELAY TIME, HIGH TO LOW LEVEL OUTPUT |
TEST | TEST DATA DOCUMENT | 92220--511-034 DRAWING (THIS IS THE BASIC GOVERNING DRAWING, SUCH AS A CONTRACTOR DRAWING, ORIGINAL EQUIPMENT MANUFACTURER DRAWING, ETC.; EXCLUDES ANY SPECIFICATION, STANDARD OR OTHER DOCUMENT THAT MAY BE REFERENCED IN A BASIC GOVERNING DRA |
End Use : 21320 | Semiconductors |
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Schedule B : 8542900000 (NAICS 334413) | Electronic integrated circuits and microassembly parts |
SITC : 77689 | Parts of electronic integrated circuits and microassembles |
ADPE | Represents items with no adp components |
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CRITL | The item does not have a nuclear hardened feature or any other critical feature such as tolerance, fit restriction or application. |
ESD | B - Represents items with esd sensitivity. |
HMIC | N - Indicates there is no data in the hmirs and the nsn is in a fsc not generally suspected of containing hazardous materials. |
PMIC | A - Item does not contain precious metal. |
AAC | Y |
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Classification Control | U |
MGMT_CTL | 9n----- |
Quantity per pack | 1 |
Repariability | |
Shelf Life | N/A |
SOS | S9e |
Unit of Measure | Ea |
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