Please submit your quote request for NSN part SZG20110H (Semiconductor Device Diode) using the RFQ form below. This part SZG20110H is manufactured by Freescale Semiconductor Inc (04713) and carries NSN 5961-01-097-2667. To expedite processing, kindly provide the requested quantity and need-by date in the designated form fields.
For reference, this part SZG20110H has an NSN of 5961-01-097-2667, with a NIIN of 01-097-2667 and an NCB Code of 01 (USA). It falls under FSG 59 Electrical and Electronic Equipment Components and FSC 5961 Semiconductor Devices and Associated Hardware for classification purposes. Providing complete details ensures we prioritize your request effectively.
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| NSN | FSC | NIIN | CLS | Hazmat | DEMIL | Cancelled NSN |
|---|---|---|---|---|---|---|
| 5961-01-097-2667 Item Description: Semiconductor Device Diode | 5961 | 010972667 | 0 | B | ||
| CIIC | HCC | ESD | PMIC | Criticality | ENAC | |
| 7 | B | A | 0 | |||
| Part Number | ISC | RNVC | RNCC | HCC | MSDS | SADC |
| Szg20110h | 5 | 9 | 3 |
| MRC | Criteria | Characteristic |
|---|---|---|
| ABBH | INCLOSURE MATERIAL | GLASS |
| ABHP | OVERALL LENGTH | 2.300 INCHES MINIMUM |
| ABJT | TERMINAL LENGTH | 1.000 INCHES MINIMUM |
| ADAV | OVERALL DIAMETER | 0.104 INCHES MAXIMUM |
| AGAV | END ITEM IDENTIFICATION | LGM 30 MINUTEMAN |
| AKPV | MOUNTING FACILITY QUANTITY | 2 |
| AXGY | MOUNTING METHOD | UNTHREADED HOLE |
| CTMZ | SEMICONDUCTOR MATERIAL | SILICON |
| CTQN | VOLTAGE RATING IN VOLTS PER CHARACTERISTIC | 8.820 MAXIMUM BREAKDOWN VOLTAGE, DC |
| CTQX | CURRENT RATING PER CHARACTERISTIC | 100.00 NANOAMPERES MAXIMUM REVERSE CURRENT, DC |
| CTSG | MAXIMUM OPERATING TEMP PER MEASUREMENT POINT | 175.0 DEG CELSIUS AMBIENT AIR |
| NHCF | NUCLEAR HARDNESS CRITICAL FEATURE | HARDENED |
| TTQY | TERMINAL TYPE AND QUANTITY | 2 UNINSULATED WIRE LEAD |
| End Use : 21320 | Semiconductors |
|---|---|
| Schedule B : 8541100070 (NAICS 334413) | Diodes, other than photosensitve or led, with a current of 0.5 a or less |
| SITC : 77631 | Diodes, not photosensitive nor light emitting diodes |
| ADPE | Represents items with no adp components |
|---|---|
| CRITL | The item is specifically designed to be or selected as being nuclear hard (i.E., it will continue to perform its designed function in an environment created by a nuclear explosion). the item does not have other critical features. |
| ESD | B - Represents items with esd sensitivity. |
| PMIC | A - Item does not contain precious metal. |
| AAC | D |
|---|---|
| Classification Control | U |
| MGMT_CTL | ------- |
| Quantity per pack | 1 |
| Repariability | |
| Shelf Life | N/A |
| SOS | Fgz |
| Unit of Measure | Ea |
| ACC: | H - Instruments/equipment/supplies for radio, communications, electrical, laboratory, etc. (includes signal corps) |
|---|---|
| ADC: | A - Shipment is not a consolidation and does not exceed 84 inches in any dimension. |
| LTL: | W - Rating variable |
| NMFC: | 063025 - Semiconductors/devices noi etc |
| SHC: | 9 - Other or no special handling required (sh) |
| TCC: | 3 - Electrostatic sensitive device (esd) |
| WCC: | 72D - Communications/electronics, other than sigint/ew or comsec repair parts and components |
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