Please submit your quote request for NSN part 356A1469P18 (Microcircuit Memory) using the RFQ form below. This part 356A1469P18 is manufactured by Bae Systems Controls Inc (89954) and carries NSN 5962-01-549-7602. To expedite processing, kindly provide the requested quantity and need-by date in the designated form fields.
For reference, this part 356A1469P18 has an NSN of 5962-01-549-7602, with a NIIN of 01-549-7602 and an NCB Code of 01 (USA). It falls under FSG 59 Electrical and Electronic Equipment Components and FSC 5962 Microcircuits Electronic for classification purposes. Providing complete details ensures we prioritize your request effectively.
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| NSN | FSC | NIIN | CLS | Hazmat | DEMIL | Cancelled NSN |
|---|---|---|---|---|---|---|
| 5962-01-549-7602 Item Description: Microcircuit Memory | 5962 | 015497602 | 0 | N | B | |
| CIIC | HCC | ESD | PMIC | Criticality | ENAC | |
| 7 | B | A | 0 | |||
| Part Number | ISC | RNVC | RNCC | HCC | MSDS | SADC |
| 356a1469p18 | 5 | 2 | 3 |
| MRC | Criteria | Characteristic |
|---|---|---|
| ADAQ | BODY LENGTH | 14.0 MILLIMETERS NOMINAL |
| ADAT | BODY WIDTH | 14.0 MILLIMETERS NOMINAL |
| ADAU | BODY HEIGHT | 1.4 MILLIMETERS MINIMUM AND 1.5 MILLIMETERS MAXIMUM |
| AFGA | OPERATING TEMP RANGE | -55.0/+125.0 DEG CELSIUS |
| AGAV | END ITEM IDENTIFICATION | NHA PN 114E9338G2 CAGE 89954 E/I C-17A AIRCRAFT |
| CBBL | FEATURES PROVIDED | ELECTROSTATIC SENSITIVE AND SELECTED ITEM |
| CQSJ | INCLOSURE MATERIAL | PLASTIC |
| CQSZ | INCLOSURE CONFIGURATION | LEADED CHIP CARRIER |
| CXCY | PART NAME ASSIGNED BY CONTROLLING AGENCY | MICROCIRCUIT, DIGITAL HIGH SPEED 32 K X 16 DUAL PORT STATIC RAM |
| CZEN | VOLTAGE RATING AND TYPE PER CHARACTERISTIC | 5.0 VOLTS NOMINAL POWER SOURCE |
| CZEP | CAPITANCE RATING PER CHARACTERISTIC | 9.00 INPUT PICOFARADS MAXIMUM AND 10.00 OUTPUT PICOFARADS MAXIMUM |
| CZEQ | TIME RATING PER CHACTERISTIC | 25.00 NANOSECONDS MAXIMUM ACCESS |
| CZER | MEMORY DEVICE TYPE | RAM |
| CZZZ | MEMORY CAPACITY | 512 K |
| SPCL | SPECIAL TEST FEATURES | EXTENDED TEMPERATURE RANGE TESTING AT -55 TO + 125 DEG CELSIUS OF IDT7027L25PFISCD2703 |
| TEST | TEST DATA DOCUMENT | 89954-356A1469 DRAWING (THIS IS THE BASIC GOVERNING DRAWING, SUCH AS A CONTRACTOR DRAWING, ORIGINAL EQUIPMENT MANUFACTURER DRAWING, ETC.; EXCLUDES ANY SPECIFICATION, STANDARD OR OTHER DOCUMENT THAT MAY BE REFERENCED IN A BASIC GOVERNING DRA |
| TTQY | TERMINAL TYPE AND QUANTITY | 100 GULLWING |
| End Use : 21320 | Semiconductors |
|---|---|
| Schedule B : 8542900000 (NAICS 334413) | Electronic integrated circuits and microassembly parts |
| SITC : 77689 | Parts of electronic integrated circuits and microassembles |
| ADPE | Represents items with no adp components |
|---|---|
| CRITL | The item does not have a nuclear hardened feature or any other critical feature such as tolerance, fit restriction or application. |
| ESD | B - Represents items with esd sensitivity. |
| HMIC | N - Indicates there is no data in the hmirs and the nsn is in a fsc not generally suspected of containing hazardous materials. |
| PMIC | A - Item does not contain precious metal. |
| AAC | D |
|---|---|
| Classification Control | 7 |
| MGMT_CTL | ------- |
| Quantity per pack | 1 |
| Repariability | |
| Shelf Life | N/A |
| SOS | F77 |
| Unit of Measure | Ea |
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