Please submit your quote request for NSN part 312A5764P1 (Microcircuit Memory) using the RFQ form below. This part 312A5764P1 is manufactured by Bae Systems Controls Inc (89954) and carries NSN 5962-01-348-7405. To expedite processing, kindly provide the requested quantity and need-by date in the designated form fields.
For reference, this part 312A5764P1 has an NSN of 5962-01-348-7405, with a NIIN of 01-348-7405 and an NCB Code of 01 (USA). It falls under FSG 59 Electrical and Electronic Equipment Components and FSC 5962 Microcircuits Electronic for classification purposes. Providing complete details ensures we prioritize your request effectively.
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| MRC | Criteria | Characteristic |
|---|---|---|
| ADAT | BODY WIDTH | 0.515 INCHES MINIMUM AND 0.600 INCHES MAXIMUM |
| ABHP | OVERALL LENGTH | 1.235 INCHES MINIMUM AND 1.285 INCHES MAXIMUM |
| CZER | MEMORY DEVICE TYPE | EEPROM |
| CRTL | CRITICALITY CODE JUSTIFICATION | FEAT |
| CBBL | FEATURES PROVIDED | HERMETICALLY SEALED AND W/ENABLE AND MONOLITHIC AND BIDIRECTIONAL AND BURN IN AND POSITIVE OUTPUTS AND ELECTROSTATIC SENSITIVE |
| CQWX | OUTPUT LOGIC FORM | TRANSISTOR-TRANSISTOR LOGIC |
| CTQX | CURRENT RATING PER CHARACTERISTIC | 125.00 MILLIAMPERES REVERSE CURRENT, DC ABSOLUTE |
| CQSZ | INCLOSURE CONFIGURATION | DUAL-IN-LINE |
| ABKW | OVERALL HEIGHT | 0.385 INCHES MAXIMUM |
| AFGA | OPERATING TEMP RANGE | -55.0/+125.0 DEG CELSIUS |
| AFJQ | STORAGE TEMP RANGE | -65.0/+150.0 DEG CELSIUS |
| CQSJ | INCLOSURE MATERIAL | CERAMIC |
| CQZP | INPUT CIRCUIT PATTERN | 22 INPUT |
| CWSG | TERMINAL SURFACE TREATMENT | SOLDER |
| CZEN | VOLTAGE RATING AND TYPE PER CHARACTERISTIC | 0.3 VOLTS MINIMUM POWER SOURCE AND 6.0 VOLTS MAXIMUM POWER SOURCE |
| CZEP | CAPITANCE RATING PER CHARACTERISTIC | 6.00 INPUT PICOFARADS MAXIMUM AND 10.00 OUTPUT PICOFARADS MAXIMUM |
| ADAQ | BODY LENGTH | 1.235 INCHES MINIMUM AND 1.285 INCHES MAXIMUM |
| ADAU | BODY HEIGHT | 0.140 INCHES MINIMUM AND 0.175 INCHES MAXIMUM |
| CTFT | CASE OUTLINE SOURCE AND DESIGNATOR | D-3 MIL-M-38510 |
| FEAT | SPECIAL FEATURES | ALTERED ITEM AND NUCLEAR HARDNESS CRITICAL PROCESS |
| TEST | TEST DATA DOCUMENT | 96906-MIL-STD-883 STANDARD (INCLUDES INDUSTRY OR ASSOCIATION STANDARDS, INDIVIDUAL MANUFACTUREER STANDARDS, ETC.). |
| TTQY | TERMINAL TYPE AND QUANTITY | 24 PRINTED CIRCUIT |
| End Use : 21320 | Semiconductors |
|---|---|
| Schedule B : 8542900000 (NAICS 334413) | Electronic integrated circuits and microassembly parts |
| SITC : 77689 | Parts of electronic integrated circuits and microassembles |
| ADPE | Represents items with no adp components |
|---|---|
| CRITL | The item does not have a nuclear hardened feature but does have other critical featur (s) such as tolerance, fit restrictions or application. |
| ESD | B - Represents items with esd sensitivity. |
| HMIC | N - Indicates there is no data in the hmirs and the nsn is in a fsc not generally suspected of containing hazardous materials. |
| PMIC | A - Item does not contain precious metal. |
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